A Prototype Si/CdTe Compton Camera and the Polarization Measurement

Details A Prototype Si/CdTe Compton Camera and the Polarization Measurement A Prototype Si/CdTe Compton Camera and the Polarization Measurement

2004-10-05

arxiv.org/abs/astro-ph/0410126v1

IEEE Trans.Nucl.Sci. 51 (2004) 2432-2437

Astronomy and Astrophysics

Astrophysics

6 pages, 11 figures, to be published in IEEE Trans. Nucl. Sci. Vol. 51 (2004)

Scientific paper

10.1109/TNS.2004.835653

A Compton camera is the most promising approach for gamma-ray detection in the energy region from several hundred keV to MeV, especially for application in high energy astrophysics. In order to obtain good angular resolution, semiconductor detectors such as silicon, germanium and cadmium telluride(CdTe) have several advantages over scintillation detectors, which have been used so far. Based on the recent advances of high resolution CdTe and silicon imaging detectors, we are working on a Si/CdTe Compton camera. We have developed 64-pixel CdTe detectors with a pixel size of 2mmx2mm and double-sided Si strip detectors(DSSDs) with a position resolution of 800 micron. As a prototype Si/CdTe Compton camera, we use a DSSD as a scatterer and two CdTe pixel detectors as an absorber. In order to verify its performance, we irradiate the camera with 100% linearly polarised 170keV gamma-rays and demonstrate the system works properly as a Compton camera. The resolution of the reconstructed scattering angle is 22 degrees(FWHM). Measurement of polarization is also reported. The polarimetric modulation factor is obtained to be 43%, which is consistent with the prediction of Monte Carlo simulations.

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