A novel X-ray diffraction technique with almost complete insensitivity to sample morphology

Details A novel X-ray diffraction technique with almost complete insensitivity to sample morphology A novel X-ray diffraction technique with almost complete insensitivity to sample morphology

Oct 2011

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011epsc.conf..145h&link_type=abstract

EPSC-DPS Joint Meeting 2011, held 2-7 October 2011 in Nantes, France. http://meetings.copernicus.org/epsc-dps2011, p.145

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The author has recently invented a novel X-ray diffraction (XRD) technique which exhibits almost complete insensitivity to the sample morphology, and also to the sample distance other than an intensity factor. The method is suitable for planetary applications, requiring no or very minimal sample preparation. The technique implements energydispersive XRD (EDXRD) in a back-reflection geometry. The intrinsic geometry of the method and the simplicity inherent to EDXRD enables a compact lightweight instrument design with no moving parts. Details of the basic concept and of proof-of-principle experiments are presented here.

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