A new readout scheme for imaging TES based on cooling time measurement

Details A new readout scheme for imaging TES based on cooling time measurement A new readout scheme for imaging TES based on cooling time measurement

Feb 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002aipc..605..325n&link_type=abstract

LOW TEMPERATURE DETECTORS: Ninth International Workshop on Low Temperature Detectors. AIP Conference Proceedings, Volume 605, p

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Superconducting Quantum Interference Devices, Signal Processing Electronics, X-Ray And Gamma-Ray Spectrometers

Scientific paper

We are developing a tungsten transition edge sensor (W-TES) for x-ray imaging spectroscopy applications. The conventional readout scheme for TES array has a great difficulty in reading out multi-channel x-ray signals. Therefore we have considered a new readout scheme for a W-TES array. This scheme is based on a cooling time measurement in a saturation mode. In this scheme, we only need time information, therefore we can expect to simplify a readout system. Although the currently achieved energy resolution of our W-TES (0.5 mm×0.5 mm) using the cooling time measurement is 55 eV (FWHM) at 5.9 keV, much higher energy resolution is expected by making smaller devices. .

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