A New Method to Quantify X-ray Substructures in Clusters of Galaxies

Details A New Method to Quantify X-ray Substructures in Clusters of Galaxies A New Method to Quantify X-ray Substructures in Clusters of Galaxies

2011-12-08

arxiv.org/abs/1112.1971v3

2012 ApJ 746 139

Astronomy and Astrophysics

Astrophysics

Cosmology and Extragalactic Astrophysics

13 pages, 17 figures, accepted for publication in ApJ (http://iopscience.iop.org/0004-637X/746/2/139/)

Scientific paper

10.1088/0004-637X/746/2/139

We present a new method to quantify substructures in clusters of galaxies, based on the analysis of the intensity of structures. This analysis is done in a residual image that is the result of the subtraction of a surface brightness model, obtained by fitting a two-dimensional analytical model (beta-model or S\'ersic profile) with elliptical symmetry, from the X-ray image. Our method is applied to 34 clusters observed by the Chandra Space Telescope that are in the redshift range 0.02

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