A New Method to Measure the System Noise Temperature Using a 2-bit A/D

Details A New Method to Measure the System Noise Temperature Using a 2-bit A/D A New Method to Measure the System Noise Temperature Using a 2-bit A/D

Aug 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009aspc..402...81n&link_type=abstract

Approaching Micro-Arcsecond Resolution with VSOP-2: Astrophysics and Technologies ASP Conference Series, Vol. 402, proceedings o

Astronomy and Astrophysics

Astrophysics

Scientific paper

We propose a new method to measure the system noise temperature (Tsys) without a power meter. We measure it using a high-speed analogue-to-digital (A/D) converter that is available for an interferometric data acquisition system. The bit distribution of a four-level quantizer corresponds to the input power after the converter. Comparing the bit distributions, we can estimate the power ratio with the noise source on and off. We report performance of this method by comparing it with the conventional method. Using this method, we will no longer need a power meter on-board ASTRO-G.

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