A New Method for High Fidelity Deconvolution of Interferometric Images

Details A New Method for High Fidelity Deconvolution of Interferometric Images A New Method for High Fidelity Deconvolution of Interferometric Images

Dec 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001aas...19915704r&link_type=abstract

American Astronomical Society, 199th AAS Meeting, #157.04; Bulletin of the American Astronomical Society, Vol. 34, p.565

Astronomy and Astrophysics

Astronomy

Scientific paper

``Smear fitting'' is a new method for converting measured visibilities into images. It models a source as a set of basis functions (usually elliptical Gaussians) to fit the visibilities by minimizing χ2. The components are often unresolved along one or both axes, so smear fitting broadens the components to account for the uncertainty in their locations and shapes, raising χ2 by the number of degrees of freedom in the process. This results in typically much sharper resolution than CLEAN, while still using the maximum sensitivity of natural weighting. It also avoids the ``ringing'' artifacts produced by maximum entropy when sharp emission is on top of a diffuse background. Smear fitting has been implemented as a freely available patch to difmap, and several examples of its use will be shown.

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