A hard X-ray polarimeter utilizing Compton scattering

Details A hard X-ray polarimeter utilizing Compton scattering A hard X-ray polarimeter utilizing Compton scattering

Feb 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1343..512s&link_type=abstract

IN: X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography; Proceedings of the Meeting, San Diego,

Computer Science

Performance

2

Astronomical Polarimetry, Compton Effect, Polarimeters, X Ray Scattering, Fabrication, Performance Tests, X Ray Astronomy

Scientific paper

The paper describes a 50-cm-diam prototype of a novel Compton-scattering-type polarimeter for hard X-rays in the energy range 30-100 keV. The characteristics of the prototype polarimeter were investigated for various conditions. It was found that, with polarized X-rays from a simple polarizer, the detection efficiency and the modulation factor of the polarimeter with a 40-mm thick scatterer were 3.2 percent and 0.57 percent, respectively, at about 60 keV.

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