A correction factor for Gaussian deconvolution of optically thick linewidths in homogeneous sources

Details A correction factor for Gaussian deconvolution of optically thick linewidths in homogeneous sources A correction factor for Gaussian deconvolution of optically thick linewidths in homogeneous sources

Dec 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999mnras.310..693k&link_type=abstract

Monthly Notices of the Royal Astronomical Society, Volume 310, Issue 3, pp. 693-702.

Astronomy and Astrophysics

Astronomy

Line: Profiles, Radiative Transfer, Sun: Prominences

Scientific paper

Profiles of optically thick, non-Gaussian emission lines convolved with Gaussian instrumental profiles are constructed, and are deconvolved on the usual Gaussian basis to examine the departure from accuracy thereby caused in `measured' linewidths. It is found that `measured' linewidths underestimate the true linewidths of optically thick lines, by a factor which depends on the resolution factor r=Doppler width/instrumental width and on the optical thickness τ0. An approximate expression is obtained for this factor, applicable in the range of at least 0<=τ0<=10, which can provide estimates of the true linewidth and optical thickness.

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