Computer Science – Performance
Scientific paper
Sep 1982
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1982rema.rept..467t&link_type=abstract
In ESA Reliability and Maintainability p 467-474 (SEE N83-20178 10-38)
Computer Science
Performance
Circuit Reliability, Encapsulated Microcircuits, Evaluation, Performance Tests, Random Access Memory, Reliability Analysis, Alpha Particles, Computer Techniques, Errors, Service Life
Scientific paper
A reliability evaluation in the development stage was carried out to evaluate the error rate and mode of soft and/or hard error for the plastic encapsulated Mitsubishi's 64 K bit NMOS dynamic RAMs (M5K4164P, NP) by using a computer aided test and diagnostic system. In order to evaluate these error rates systematically, the computer aided test and diagnostic system was developed, which consists of three test steps, device evaluation tests, watching operation life tests, and computer installed evaluation tests based on conception of the reliability evaluation for new products.
Fujimoto Minoru
Higuchi Katsuhiko
Hosomi S.
Iwatsuki M.
Matsumoto Haru
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