A comprehensive range of X-ray ionized reflection models

Details A comprehensive range of X-ray ionized reflection models A comprehensive range of X-ray ionized reflection models

2005-01-07

arxiv.org/abs/astro-ph/0501116v1

Mon.Not.Roy.Astron.Soc.358:211-216,2005

Astronomy and Astrophysics

Astrophysics

6 pages, 8 Figures, accepted for publication in MNRAS

Scientific paper

10.1111/j.1365-2966.2005.08797.x

X-ray ionized reflection occurs when a surface is irradiated with X-rays so intense that its ionization state is determined by the ionization parameter xi propto F/n, where F is the incident flux and n the gas density. It occurs in accretion, onto compact objects including black holes in both active galaxies and stellar-mass binaries, and possibly in gamma-ray bursts. Computation of model reflection spectra is often time-consuming. Here we present the results from a comprehensive grid of models computed with our code, which has now been extended to include what we consider to be all energetically-important ionization states and transitions. This grid is being made available as an ionized-reflection model, REFLION, for XSPEC.

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