Other
Scientific paper
May 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.5144..323s&link_type=abstract
Optical Measurement Systems for Industrial Inspection III. Edited by Osten, Wolfgang. Proceedings of the SPIE, Volume 5144, pp.
Other
Scientific paper
In the past few years two form or topography measuring methods have been developed at PTB that are based on measuring the slope (angle) difference or the curvature, which both are intrinsic properties of the surface. In a laboratory environment the methods offer a very low uncertainty of measurement down to, or in part even below, the nanometer range. One of them is the Extended Shear Angle Difference method (ESAD), in which the angle difference signal of two surface points separated by a rather large shear is the basic measurement signal obtained with an autocollimation telescope. The other is Large Area Curvature Scanning (LACS) where the curvature values of the surface elements along a scan line are captured by a small interferometer. Error and uncertainty considerations are given for these methods which form the basis for determining the uncertainty which can be achieved under well optimized environmental conditions as necessary for tracing back and calibrating other measuring systems. Additionally, the uncertainty that can be reached in an industrial environment is discussed, and solutions are described to use these promising techniques also in such cases.
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