Millimeter-wave, shot-noise limited, fixed-tuned mixer

Details Millimeter-wave, shot-noise limited, fixed-tuned mixer Millimeter-wave, shot-noise limited, fixed-tuned mixer

Nov 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985itmtt..33.1172f&link_type=abstract

IEEE Transactions on Microwave Theory and Techniques (ISSN 0018-9480), vol. MTT-33, Nov. 1985, p. 1172-1178.

Computer Science

Performance

1

Electronic Equipment Tests, Microwave Circuits, Millimeter Waves, Mixing Circuits, Schottky Diodes, Shot Noise, Automatic Test Equipment, Cryogenic Equipment, Low Noise, Noise Temperature, Single Sideband Transmission, Tuning, Volt-Ampere Characteristics

Scientific paper

In a companion paper, (Faber and Archer, 1985), two computer-controlled measurement systems for testing millimeter-wave Schottky-barrier diode mixers between 90 and 350 GHz have been presented. In this paper, a typical application of the measurement system to the testing and evaluation of a practical W-band, cryogenic, fixed-tuned Schottky diode mixer is used to demonstrate the performance of the instruments. The mixer is shown to have a single-sideband noise temperature of less than 140 K between 98 and 118 GHz and, at 110 GHz, achieves shot-noise limited performance, with a SSB noise temperature of only 81 K and corresponding conversion loss of 5.7 dB.

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