WFC3: Correction of UVIS Fringing Effects at Long Wavelengths

Astronomy and Astrophysics – Astronomy

Scientific paper

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Scientific paper

The UVIS detector in Wide Field Camera 3 includes two thinned, backside-illuminated, e2v Technologies CCDs. The silicon detector layers in these devices become increasingly transparent at wavelengths longer than about 700 nm. Long wavelength images therefore feature fringing patterns caused by multiple reflections between layer interfaces in the detector assembly. However, because fringing patterns are highly wavelength-dependent, even the narrowband F656N filter (H-alpha) is affected by fringing.
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To characterize fringing, monochromatic flat fields were acquired in two thermal vacuum test campaigns. In the earlier campaign, 150 images per CCD sampled wavelengths between 700 and 1060 nm at an incidence angle of 0 degrees. In the second campaign, 77 images per CCD sampled wavelengths between 845 and 990 nm at 21 degrees incidence (the same as flight geometry).
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An eight-layer thin-film interference model is used to solve the Fresnel equations (Malumuth et al. 2003, Proc. SPIE 4854, 567-576). The multi-wavelength ground testing data set provides the constraints necessary to determine the thin-film model's free parameters: thicknesses and roughness of each layer. This approach is theoretically capable of correcting on-orbit data taken at 656 nm, even though no calibration data were taken at such short wavelengths.
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We will present the model-based fringe corrections currently under development. For example, 33% peak fringe amplitude at 927 nm can be reduced to 7% amplitude using our preliminary model solution. We will discuss fringing correction strategies for support of WFC3 users with narrowband long-wavelength UVIS data.

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