STIS CCD Performance Monitor {continued}

Details STIS CCD Performance Monitor {continued} STIS CCD Performance Monitor {continued}

Dec 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997hst..prop.8057g&link_type=abstract

HST Proposal ID #8057

Computer Science

Performance

Hst Proposal Id #8057

Scientific paper

This activity measures the baseline performance and commandability of the CCD subsystem. Bias, Dark, and Flat Field exposures are taken in order to measure read noise, dark current, CTE, and gain. Numerous bias frames are taken to permit construction of "superbias" frames in which the effects of read noise have been rendered negligible. Dark exposures are made outside the SAA. Full frame and binned observations are made, with binning factors of 2 x 1, 1 x 2, 2 x 2, 4 x 1, and 4 x 2. All exposures are internals.

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