STIS CCD Hot Pixel Annealing

Details STIS CCD Hot Pixel Annealing STIS CCD Hot Pixel Annealing

Dec 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997hst..prop.7635h&link_type=abstract

HST Proposal ID #7635

Computer Science

Performance

Hst Proposal Id #7635

Scientific paper

The effectiveness of the CCD hot pixel annealing process is assessed by
measuring the dark current behavior before and after annealing and by
searching for any window contamination effects. In addition CTE
performance is examined by looking for traps in a low signal level flat.
Adapted from SMOV 7107.

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