New Prep Pattern for NICMOS Darks

Details New Prep Pattern for NICMOS Darks New Prep Pattern for NICMOS Darks

Dec 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997hst..prop.7155r&link_type=abstract

HST Proposal ID #7155

Computer Science

Hst Proposal Id #7155

Scientific paper

To investigate the DC offset in the first dark readout after sitting in the NICMOS flush pattern, three sets of multiaccum darks will be taken. These multiaccum sets will be preceded by varying numbers of simple ACCUM exposures to test whether a warm-up is required when moving from the auto-flush pattern to real data acquisition. The observed behavior to date suggests that the DC offset seen between the first of a set of darks and the remainder may be the result of either the output amplifiers or some component in the signal processing chain changing state between the auto-flush mode and the data taking modes. This proposal will test a simple way to avoid having the first readout being systematically different by inserting some short exposures at the beginning of a data set.

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