STIS CCD functional

Details STIS CCD functional STIS CCD functional

Dec 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997hst..prop.7061k&link_type=abstract

HST Proposal ID #7061

Computer Science

Performance

Hst Proposal Id #7061

Scientific paper

This activity measures the baseline performance and commandability of the CCD subsystem. Only primary amplifier D is used. Bias, Dark, and Flat Field exposures are taken in order to measure read noise, dark current, CTE, and gain. Numerous bias frames are taken to permit construction of "super bias" frames in which the effects of read noise have been rendered negligible. Dark exposures are made inside and outside the SAA. Full frame and binned observations are made, with binning factors of 2 x 1, 1 x 2, and 2 x 2. All exposures are internals.

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