The Chandra Multi-wavelength Project (ChaMP): X-ray Data Analysis

Details The Chandra Multi-wavelength Project (ChaMP): X-ray Data Analysis The Chandra Multi-wavelength Project (ChaMP): X-ray Data Analysis

Oct 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000head....5.2604k&link_type=abstract

American Astronomical Society, HEAD Meeting #5, #26.04; Bulletin of the American Astronomical Society, Vol. 32, p.1223

Astronomy and Astrophysics

Astronomy

Scientific paper

We present step-by-step X-ray data analysis procedures as part of the Chandra Multi-wavelength Project. They consist of additional data corrections and data screening post CXC Standard Data Processing Rev 1 and the determination of sources and their X-ray properties. Using 3 deep ACIS imaging fields (MS 1137.5+6625, CL0848.6+4453 and A0620-00) with exposure times ranging from 50 ks to 190 ks, we discuss in particular gain correction, aspect correction, removing bad pixels and node boundaries, removing ACIS flaring pixels, streak correction for the S4 chip and excluding high background intervals. Optimal parameters for source detection and X-ray source properties such as X-ray colors are also discussed.

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