Applied focused ion beam techniques for sample preparation of astromaterials for integrated nanoanalysis

Details Applied focused ion beam techniques for sample preparation of astromaterials for integrated nanoanalysis Applied focused ion beam techniques for sample preparation of astromaterials for integrated nanoanalysis

Mar 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008m%26ps...43..561g&link_type=abstract

Meteoritics & Planetary Science, vol. 43, Issue 3, p.561-569

Mathematics

Logic

3

Scanning Electron Microscopy (Sem), Stardust Space Missions, Interplanetary Dust Particles (Idps)

Scientific paper

Sample preparation is always a critical step in the study of micrometer-sized astromaterials available for study in the laboratory, whether their subsequent analysis is by electron microscopy or secondary ion mass spectrometry. A focused beam of gallium ions has been used to prepare electron transparent sections from an interplanetary dust particle (IDP), as part of an integrated analysis protocol to maximize the mineralogical, elemental, isotopic, and spectroscopic information extracted from one individual particle. In addition, focused ion beam (FIB) techniques have been employed to extract cometary residue preserved on the rims and walls of microcraters in 1100 series aluminum foils that were wrapped around the sample tray assembly on the Stardust cometary sample collector. Non-ideal surface geometries and inconveniently located regions of interest required creative solutions. These include support pillar construction and relocation of a significant portion of sample to access a region of interest. Serial sectioning, in a manner similar to ultramicrotomy, is a significant development and further demonstrates the unique capabilities of focused ion beam microscopy for sample preparation of astromaterials.

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