Metric nonlinearities of microchannel plate detectors

Details Metric nonlinearities of microchannel plate detectors Metric nonlinearities of microchannel plate detectors

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1344..194h&link_type=abstract

IN: EUV, X-ray, and Gamma-ray instrumentation for astronomy; Proceedings of the Meeting, San Diego, CA, July 11-13, 1990 (A92-20

Computer Science

Sound

Microchannel Plates, Rocket-Borne Instruments, Solar Spectra, Ultraviolet Detectors, Ultraviolet Spectroscopy, Doppler Effect, Extreme Ultraviolet Radiation, Solar Corona, Sounding Rockets, Spectral Resolution

Scientific paper

Metric nonlinearities in microchannel plate detectors have been mapped using a small spot of UV light scanned across the detector. The centroid of the detected image is accurately located, and corrections to the wavelength scale are made to determine the precise absolute Doppler shifts of the solar emission lines. The possible causes of the observed nonlinearities are briefly discussed.

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