High Spatial Resolution Analyses of GEMS and Other Ultrafine Grained IDP Components

Details High Spatial Resolution Analyses of GEMS and Other Ultrafine Grained IDP Components High Spatial Resolution Analyses of GEMS and Other Ultrafine Grained IDP Components

Mar 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999lpi....30.2031b&link_type=abstract

30th Annual Lunar and Planetary Science Conference, March 15-29, 1999, Houston, TX, abstract no. 2031

Computer Science

5

Scientific paper

Ultrathin microtome sections,using new techniques, has permitted
elemental analysis of IDP components that are smaller than 100 nm. These
studies indicate the glass component of GEMS has very low Fe content and
the residual Fe content may reside in nm-size sulfides.

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