WF/PC2 Cycle 4: Optimum Preflash Time Test

Details WF/PC2 Cycle 4: Optimum Preflash Time Test WF/PC2 Cycle 4: Optimum Preflash Time Test

Jul 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994hst..prop.5645c&link_type=abstract

HST Proposal ID #5645

Computer Science

Hst Proposal Id #5645

Scientific paper

Analysis of Omega Cen calibration fields has revealed what appears to be a variation of ~10% across each CCD in the direction of the columns (parallel register). On the basis of analysis done by the WFPC2 Science Team and STScI we have established the following facts: 1) A variation of ~10% is seen in Omega Cen images across each chip in the direction of the columns (parallel register). 2) This effect is not removed by flat fielding, nor, does it appear to be intrinsic to the flat fields themselves. 3) It is also seen in analysis of cosmic ray events in long dark frames. 4) Pre-assembly engineering data does not appear to show the effect (John Trauger). This proposal will determine the proper - and minimum - preflash time required to compensate for the 10% variation. A series of F555W exposures will be taken, each preflashed at different levels. Set of 15 preflash times will span the range of ~5e- to 200e-.

Affiliated with

Also associated with

No associations

Rating

WF/PC2 Cycle 4: Optimum Preflash Time Test does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with WF/PC2 Cycle 4: Optimum Preflash Time Test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and WF/PC2 Cycle 4: Optimum Preflash Time Test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-819930