Computer Science
Scientific paper
Nov 1998
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998sct..conf...79w&link_type=abstract
Proceedings of the 6th Spacecraft Charging Conference. November 2-6, 1998. AFRL Science Center, Hanscom AFB, MA, USA., p.79-83
Computer Science
Scientific paper
This paper reports measurements of the secondary and backscatter electron energy and angle emission distributions from metals, generated by incident electrons with energies from ~100 eV to ~20 keV. When an energetic electron is incident on a solid surface, a considerable number of additional electrons may be produced; these where the integral is over electron emission angles: 2 , N electrons are called "secondary electrons" if emitted at and over electron emission energy: 0 < E < 50 eV. energies below 50eV and "backscatter electrons" if emitted above 50 eV. The energy and angle integrated yield for 3) backscatter electron emission coefficient (0), in most metals is less than one, but may be as large as 8 or units of # /# : more for insulators. There is a long history of secondary electron and backscatter electron measurements, mostly from metals at low incident energies. Relatively few measurements of the energy and angle distributions of the emitted electrons have been made. Even more limited is the data available for insulators and semiconductors used in where the integral is over electron emission angles: 2 , N spacecraft design. Spacecraft surface charging, differential and over electron emission energy: 50 eV < E < E . charging and deep charging are controlled or augmented by secondary and backscatter electron emission. Secondary 4) the total electron emission coefficient (F) in electron emission is an important feature of plasma-solid units of # /# : surface interactions, and may have considerable effects on the behavior of components such as solar cells in low earth orbit.
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