High-angular-resolution detection of relativistic particles and gamma rays

Details High-angular-resolution detection of relativistic particles and gamma rays High-angular-resolution detection of relativistic particles and gamma rays

Sep 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985pzhtf..11.1065d&link_type=abstract

(Pis'ma v Zhurnal Tekhnicheskoi Fiziki, vol. 11, Sept. 12, 1985, p. 1065-1068) Soviet Technical Physics Letters (ISSN 0360-120X)

Astronomy and Astrophysics

Astrophysics

Angular Resolution, Astrophysics, Gamma Rays, Relativistic Particles, Single Crystals, Cosmic Rays, Detection, Silicon, Wafers

Scientific paper

It is shown that the angular coordinates of relativistic particles can be detected within a few arcsec by using the decrease in the conduction current through a single-crystal silicon wafer oriented in such a manner that the particles pass through it in a planar channeling regime. An analogous 'gamma-ray channeling' based on the total internal reflection from the interfaces of a sandwich structure can be utilized to detect the directions of gamma rays. This approach may be suitable for developing astrophysical detectors of high-energy cosmic rays and gamma rays.

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