High-energy electron testing of CCDs for a Jovian science mission

Details High-energy electron testing of CCDs for a Jovian science mission High-energy electron testing of CCDs for a Jovian science mission

Aug 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5902..171b&link_type=abstract

Focal Plane Arrays for Space Telescopes II. Edited by Grycewicz, Thomas J.; Marshall, Cheryl J. Proceedings of the SPIE, Volume

Computer Science

Performance

Scientific paper

We present results of CCD radiation testing for a proposed Jovian mission. Samples of two candidate star tracker CCDs were irradiated with 10-MeV and 50-MeV electrons at Rensselaer Polytechnic Institute's Gaerttner LINAC. Differences in displacement damage effects on CCD parameters and star tracker performance are discussed for these two energies. Dark current, charge transfer efficiency (CTE), hot pixels, and flat-band voltage shifts are examined. Our electron data is compared to proton irradiation data taken by other experimenters. 10-MeV electron-induced transient data are also discussed.

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