Measurements of surface scattering from mirrored surfaces using a triple axis X-ray spectrometer

Details Measurements of surface scattering from mirrored surfaces using a triple axis X-ray spectrometer Measurements of surface scattering from mirrored surfaces using a triple axis X-ray spectrometer

Sep 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985esasp.239..221c&link_type=abstract

In ESA Proceedings of ESA Workshop on a Cosmic X-Ray Spectroscopy Mission p 221-228 (SEE N86-22461 12-89)

Other

Mirrors, Spectrometers, X Ray Scattering, X Ray Telescopes, Gold Coatings, Quality Control, Surface Roughness Effects, Thin Films

Scientific paper

In developing a high throughput X-ray telescope for XMM, various techniques were employed to deposit a thin film of Au on a smooth substrate. A triple axis X-ray spectrometer was employed to measure the reflectivity and surface scattering of the gold surface or the substrates. For comparison, the same kind of measurements were performed on a high quality Au-coated test flat for EXOSAT and a Pt-coated test flat for AXAF. In the triple axis spectrometer a perfect channel cut Si crystal extracts Fe K radiation from a conventional X-ray tube. The X-rays are incident on the thin film surface at grazing angles and the specularly reflected and scattered radiation from the thin film is analyzed by another perfect Si crystal. A tailless probe of the scattered X-rays is obtained when the X-rays are reflected several times through a channel in each of the perfect Si crystals. It is demonstrated that the technique provides an excellent and detailed test of the quality of the mirror surface.

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