Trace Element Determinations in Presolar SiC Grains by Synchrotron X-Ray Fluorescence: Commencement of a Coordinated Multimethod Study

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Scientific paper

We determined trace element compositions of individual ~1-3 ?m presolar
SiC grains from 6 KJG grains and 26 additionally cleaned KJG grains from
the Murchison CM chondrite using nondestructive synchrotron X-ray
fluorescence (SXRF).

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