Instrument design and test results of the new all-reflection spatial heterodyne spectrometer

Details Instrument design and test results of the new all-reflection spatial heterodyne spectrometer Instrument design and test results of the new all-reflection spatial heterodyne spectrometer

Oct 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1549..376b&link_type=abstract

In: EUV, X-ray, and gamma-ray instrumentation for astronomy II; Proceedings of the Meeting, San Diego, CA, July 24-26, 1991 (A93

Astronomy and Astrophysics

Astronomy

Computer Aided Design, Gratings (Spectra), Optical Heterodyning, Optical Measuring Instruments, Optical Reflection, Ultraviolet Spectrometers, Extreme Ultraviolet Radiation, Fourier Transformation, High Resolution, Spatial Resolution

Scientific paper

An all-reflection spatial heterodyne spectrometer (SHS) has been recently developed. The advantages over conventional high-resolution grating spectrometers are that the SHS requires no mechanical scanning, a self-compensating optical design permits easy alignment, and it is much smaller than other spectrometers of comparable resolution. Since all beam-splits and recombinations occur by reflection off of a diffraction grating, the interferometer is capable of operating well into the extreme ultraviolet (EUV) and possibly into the soft X-ray region. A description of the design and the characteristics of the instrument is presented. Also, test results, including sample interferograms as well as their Fourier-transformed spectra, at both visible and UV wavelengths are shown. Finally, we report on future developments and possible applications.

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