Test chamber for low-background IR focal plane testing

Details Test chamber for low-background IR focal plane testing Test chamber for low-background IR focal plane testing

Sep 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989spie.1108...16s&link_type=abstract

IN: Test and evaluation of infrared detectors and arrays; Proceedings of the Meeting, Orlando, FL, Mar. 27-29, 1989 (A90-40352 1

Computer Science

Performance

Cryogenic Cooling, Electronic Equipment Tests, Focal Plane Devices, Infrared Detectors, Test Chambers, Vacuum Chambers, Liquid Helium, Liquid Nitrogen, Optical Measuring Instruments, Radiation Shielding, Vacuum Gages

Scientific paper

A unique and versatile vacuum chamber has been designed for JPL's IR Focal Plane Technology Group. This chamber is equipped with multiple ports for cryogen and electrical vacuum feedthroughs, pumping units, vacuum gages, sources, and detector camera heads. The design incorporates a liquid-nitrogen-cooled optical table and radiation shield for low-background IR detector testing. Focal planes can be tested at temperatures ranging from 300 K to that of liquid helium. This paper describes the design and construction of this low-background IR focal plane test chamber and discusses some of its distinctive features. An analysis of the test chamber's performance is also presented.

Affiliated with

Also associated with

No associations

Rating

Test chamber for low-background IR focal plane testing does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Test chamber for low-background IR focal plane testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test chamber for low-background IR focal plane testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1827552