Pulse-shape analysis of ionization events in low-temperature germanium detectors

Details Pulse-shape analysis of ionization events in low-temperature germanium detectors Pulse-shape analysis of ionization events in low-temperature germanium detectors

Feb 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002aipc..605..521b&link_type=abstract

LOW TEMPERATURE DETECTORS: Ninth International Workshop on Low Temperature Detectors. AIP Conference Proceedings, Volume 605, p

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2

Neutrino, Muon, Pion, And Other Elementary Particle Detectors, Cosmic Ray Detectors, Solid-State Detectors

Scientific paper

Pulse-shape analysis, supported by numerical simulations, provides a powerful tool to investigate ionization phenomena in low-temperature semiconducting detectors for the Edelweiss dark-matter experiment. We present a first application of these methods to characterize the surface, as compared with bulk ionization events. Future prospects include an investigation of space-charge effects on charge collection efficiency, with an aim towards improving the operating conditions of the detectors. .

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