Direct experimental measurement of electron impact ionization-excitation branching ratios. 2: Angular distribution of secondary electrons from N2 at 100 eV

Mathematics

Scientific paper

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Angular Distribution, Branching (Mathematics), Electron Impact, Excitation, Ionization, Nitrogen Ions, Electron Distribution, Energy Dissipation, Energy Spectra, Ionization Cross Sections

Scientific paper

The coincidence ionization experiment used previously to measure ionization-excitation branching ratios for the Chi 2Sigmag+, A 2Piu, and Beta 2Sigma+u states of N2(+) at a fixed secondary electron emission angle of 74 deg has been modified to allow the secondary emission angle to be scanned. Angular distributions of electrons which have excited the three available electronic states of the N2(+) ion have been measured at 100 eV. For the small, primary electron scattering angles where most ionization events occur the distribution for the Chi 2Sigmag+ state is found to have a peak at 57 deg with respect to the incident beam direction, while that for the A 2Piu state has a broad peak near 75 deg. The distribution for the much less intense Beta 2Sigma+u state is intermediate between the two. The partial branching ratios deduced for the 74 deg fixed angle case have been corrected to reflect the more accurate partial branching ratios obtained by integrating the secondary electron angular results. The corrected values for the Chi 2SigmaG +, A 2Piu, and Beta 2Sigma+u states are 0.56 +/- 0.05, 0.35 +/- 0.03, and 0.09 +/- 0.02, respectively. These results show that the A 2Piu state branching ratio is much smaller than deduced from a number of previous studies.

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