Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS

Details Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS

Nov 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2863..270b&link_type=abstract

Proc. SPIE Vol. 2863, p. 270-275, Current Developments in Optical Design and Engineering VI, Robert E. Fischer; Warren J. Smith;

Computer Science

Scientific paper

The optical design of a dual path imaging spectrometer and peak up camera for the IRS instrument on the SIRTF mission is discussed. The dual path configuration allows for a single area array to be simultaneously used for both low resolution spectroscopy and high resolution imagery without overlapping. This is accomplished by the use of off-axis reflective Schmidt cameras in each optical path. These cameras provide a high resolution image and a low resolution spectral image that reside side-by-side on the focal plane without residing side-by-side in the object field.

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