Automated characterization of Z-technology sensor modules

Details Automated characterization of Z-technology sensor modules Automated characterization of Z-technology sensor modules

Nov 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1541..240g&link_type=abstract

Proc. SPIE Vol. 1541, p. 240-249, Infrared Sensors: Detectors, Electronics, and Signal Processing, T. S. Jayadev; Ed.

Computer Science

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Scientific paper

Detailed radiometric characterization data must be reviewed at the module level (2048 IR detectors) prior to integrating the hardware into higher level assemblies. Software has been developed that highly automates the process of reducing test data for noise, responsivity, uniformity, output offset, saturation, linearity, filter pole location, and crosstalk. Output consists of both text and graphics at different levels of detail in order to accommodate the needs of engineering, test, manufacturing, quality assurance, and program management. All the results are placed on a LAN so that the necessary reviews can occur in essentially a paperless environment.

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