Measurements of charge diffusion in deep-depletion CCDs by optical diffraction

Details Measurements of charge diffusion in deep-depletion CCDs by optical diffraction Measurements of charge diffusion in deep-depletion CCDs by optical diffraction

Oct 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008exa....22...41c&link_type=abstract

Experimental Astronomy, Volume 22, Issue 1-2, pp. 41-49

Astronomy and Astrophysics

Astronomy

Ccd, Diffusion, Des, Detectors, Fully Depleted, Decam

Scientific paper

The charge diffusion is measured in back illuminated, fully depleted, 250 μm thick CCDs by imaging the diffraction pattern of a double slit. The CCDs studied are the focal plane detectors for the dark energy camera (DECam) instrument currently under construction for the dark energy survey (DES). The results presented here indicate that the dispersion of charge due to diffusion can be kept below the DES specification ( σ d < 7.0 μm ).

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