Low energy X-ray spectra measured with a mercuric iodide energy dispersive spectrometer in a scanning electron microscope

Details Low energy X-ray spectra measured with a mercuric iodide energy dispersive spectrometer in a scanning electron microscope Low energy X-ray spectra measured with a mercuric iodide energy dispersive spectrometer in a scanning electron microscope

Feb 1986

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1986itns...33..355i&link_type=abstract

(IEEE, DOE, NASA, et al., 1985 Nuclear Science Symposium, 32nd, and 1985 Symposium on Nuclear Power Systems, 17th, San Francisco

Computer Science

10

Electron Microscopes, Iodides, Mercury Compounds, Spectrometers, X Ray Spectroscopy, Carbon, Comets, Mariner Space Probes, Space Commercialization, Spacecraft Instruments, X Ray Spectra

Scientific paper

A mercuric iodide energy dispersive X-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K(alpha) at 5.9 keV and 195 eV (FWHM) for the Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.

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