A photometric study of the K-type contact binary EI CVn

Astronomy and Astrophysics – Astrophysics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Scientific paper

We present charge-coupled device (CCD) photometry for the short-period K-type binary EI CVn, observed on 2009 February 28 at the Xinglong Station of National Astronomical Observatories, Chinese Academy of Sciences. By using the Wilson-Devinney program, the photometric solution was first deduced from our V R observations. The results show that EI CVn is a W-type weak-contact binary with a mass ratio of qph = 0.2834(±0.0010) and an overcontact degree of f = 20.0%(±0.7%). The distorted light curves were modeled by a dark spot on the cool primary component, whose area was up to 1.9% of the area of the primary. Based on the period analysis, it is found that there exists a weak secular decrease at a rate of dP/dt = -3.11(±0.03) × 10-7d yr-1, which may be attributed to mass transfer from the primary to the secondary. With mass transfer occurring, the separation between both components will shrink, which may cause the degree of overcontact to increase. Therefore, the weak-contact binary EI CVn may evolve into a deep-contact configuration.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

A photometric study of the K-type contact binary EI CVn does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with A photometric study of the K-type contact binary EI CVn, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and A photometric study of the K-type contact binary EI CVn will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1533671

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.