Probing flare temperatures using AIA dispersion effects and RHESSI imaging/spectroscopy

Details Probing flare temperatures using AIA dispersion effects and RHESSI imaging/spectroscopy Probing flare temperatures using AIA dispersion effects and RHESSI imaging/spectroscopy

Dec 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010agufmsh23a1828r&link_type=abstract

American Geophysical Union, Fall Meeting 2010, abstract #SH23A-1828

Astronomy and Astrophysics

Astrophysics

[7519] Solar Physics, Astrophysics, And Astronomy / Flares, [7549] Solar Physics, Astrophysics, And Astronomy / Ultraviolet Emissions, [7594] Solar Physics, Astrophysics, And Astronomy / Instruments And Techniques

Scientific paper

Diffraction patterns that occur as a result of very intense, often saturated emission can provide many useful tools not ordinarily available. Specifically, analyzing dispersion features of high order diffraction patterns can provide useful insight into the thermal distributions of plasma within a structure. Here, we analyze the diffraction patterns of multiple SDO/AIA wavelength bands to more than 40 orders. Combining these results with imaging and spectroscopy from RHESSI enabled us to probe temperature and emission measure distributions within saturated flare sources.

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