Electron-impact widths of four- and five-times charged ion lines of astrophysical importance

Details Electron-impact widths of four- and five-times charged ion lines of astrophysical importance Electron-impact widths of four- and five-times charged ion lines of astrophysical importance

Aug 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993a%26as..100..237d&link_type=abstract

Astronomy and Astrophysics Supplement Series (ISSN 0365-0138), vol. 100, no. 2, p. 237-241.

Astronomy and Astrophysics

Astrophysics

8

Electron Impact, Ion Charge, Spectral Line Width, Stark Effect, Stellar Interiors, Opacity, Stellar Temperature, Transport Properties

Scientific paper

A modified semiempirical approach is used to calculate stark widths of astrophysically important spectral lines within 3 C V, 50 O V, 12 F V, 9 Ne V, 3 Al V, 6 Si V, 11 N VI, 28 F VI, 7 Na VI, 15 Si VI, 6 P VI, and 1 Cl VI multiplets. Results for 88 Stark line widths (FWHM) calculations are presented for multiplets with wavelengths greater than 1000 A. Results in the EUV, for 71 multiplets with wavelengths less than 1000 A, are given. Comparison of the present values with those calculated by using Eq. (526) in Griem (1974) shows that the obtained agreement is satisfactory.

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