Resolving microlensing events

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Scientific paper

Microlensing is traditionally that subset of gravitational lensing where the image seperation is too small to be spatially resolved. The high resolution of the SIM interferometer will allow the measurement of the second moment of the lens, the interferometric visibility. This measurement will allow us to measure the Einstein Angle of the lens, θ E. When combined with a measurement of the microlens parallax, π E, the visibility of a microlens event can yield a measurement of the mass, distance, and transverse velocity of the lens. Measuring the lens visibility thus complements measuring the lens centroid shift as a parallel method to measuring the Einstein Angle. Visibilities are the superior method for events with large θ E or with high peak amplification.
We have simulated the ability of SIM to measure the visibilities of microlensing events. We find that tracking visibilities improves SIM's ability to completely solve microlensing events. Bright events can be followed with less exposure time, fainter events than were otherwise possible can be followed, as well as very faint but high magnification events. This will the measurement of 2-4 times more events than only using image centroid shifts to measure θ E. Visibility measurements also improve the measurement of π E. Visibilities are destined to become a key microlensing tool.

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