The structure of MHD shocks in molecular outflows: grain sputtering and SiO formation

Astronomy and Astrophysics – Astronomy

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

43

Mhd, Shock Waves, Ism: Jets And Outflows, Ism: Molecules

Scientific paper

We compute the yields of Si and O in the sputtering of SiO_2 by He^+ ions, and of C from graphite. The sputtering threshold energy, particularly for the ejection of Si, is significantly higher than indicated by previous studies. The computed yields are incorporated in a C-shock code to study SiO formation in gas where the density is initially n_H=10^4 cm^-3 and the transverse magnetic induction is 100 muG. Collisional processes leading to the excitation and the dissociation of H_2, and to the associated ultraviolet fluorescence radiation, are included in the model. We find that the electron temperature profile is crucial to the dynamical and chemical structure of the shock. The electron temperature can be significantly enhanced by interactions with negative ions, such as PAH^-. The column densities of SiO computed for shock velocities nu_s~=50 km s^-1 are of the order of those observed in molecular outflow regions.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

The structure of MHD shocks in molecular outflows: grain sputtering and SiO formation does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with The structure of MHD shocks in molecular outflows: grain sputtering and SiO formation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and The structure of MHD shocks in molecular outflows: grain sputtering and SiO formation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1418864

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.