Photometric Properties of the IUE Flat-Field Calibration Exposures

Details Photometric Properties of the IUE Flat-Field Calibration Exposures Photometric Properties of the IUE Flat-Field Calibration Exposures

Nov 1980

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1980idr..conf...85d&link_type=citations

IUE Data Reduction, Proceedings of a Workshop, held in Vienna from November 18 to 20, 1980. Edited by Werner W. Weiss. Wien: In

Astronomy and Astrophysics

Astronomy

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