Precise measurements of spectral line profiles

Details Precise measurements of spectral line profiles Precise measurements of spectral line profiles

Oct 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009astbu..64..401c&link_type=abstract

Astrophysical Bulletin, Volume 64, Issue 4, pp.401-402

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Scientific paper

We present a method of precise measurements of spectral line profiles that was elaborated and tested on the Main Stellar Spectrograph (MSS) of the 6-m BTA telescope. The method allows discarding corrections for flat field. To take account of inhomogeneity of the CCD chip sensitivity, two spectra are recorded, shifted against each other along the dispersion by one column. Recurrent ratios between the photo responses of the CCD pixels let us determine their relative sensitivity and correct the line profiles. To eliminate various instability effects, the spectra are registered with the use of a cyclic shift procedure along the dispersion, and a synchronous electronic image transfer across the spectrum dispersion (along the CCD matrix columns).

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