Use of receiver functions in wide-angle controlled-source crustal data sets

Details Use of receiver functions in wide-angle controlled-source crustal data sets Use of receiver functions in wide-angle controlled-source crustal data sets

Apr 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008geoji.173..299m&link_type=abstract

Geophysical Journal International, Volume 173, Issue 8, pp. 299-308.

Astronomy and Astrophysics

Astronomy

Controlled Source Seismology, Site Effects, Wave Scattering And Diffraction, Crustal Structure, North America

Scientific paper

First-arrival waveforms remain underutilized in crustal refraction-reflection seismology by mostly reducing them to traveltime picks. However, as in earthquake seismology, the waveforms also contain important information about shallow near-receiver structures. We illustrate the use of three-component waveform analysis on the records from the ACCRETE wide-angle data set (SE Alaska and British Columbia; 1994), apply the Receiver Function (RF) methodology to the codas of P-wave arrivals, and draw two important conclusions. First, the P-wave polarization azimuths are found to be controlled by the near-receiver structures and virtually unrelated to the source-receiver backazimuths, from which they deviate by up to ~40°. This observation might be important for studies of anisotropy and also for earthquake RF studies. Second, after correcting for the polarization azimuths, clear P/S mode conversions are reliably detected within 80-400 ms following the primary arrivals. The conversions are interpreted as originating at the base of the sedimentary cover of the fjord channel. In most cases, imaging of the basement requires only several records; however, notable exceptions are also found and interpreted as caused by multipathing, localized scattering, and onsets of crustal and Moho reflections. The ACCRETE example shows that RF methodology could be useful for constraining sediment thickness and deriving P- and S-wave receiver statics in land refraction surveys where collocated reflection profiles are not available. In addition, RFs from repeatable controlled sources could be useful for testing and calibration of RF techniques.

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