Position offsets in curved-channel microchannel plate detectors

Details Position offsets in curved-channel microchannel plate detectors Position offsets in curved-channel microchannel plate detectors

Sep 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991apopt..30.3575h&link_type=abstract

Applied Optics (ISSN 0003-6935), vol. 30, Sept. 1, 1991, p. 3575-3581.

Astronomy and Astrophysics

Astronomy

2

Doppler Effect, Extreme Ultraviolet Radiation, Microchannel Plates, Ultraviolet Spectrometers, Moire Fringes, Ultraviolet Astronomy

Scientific paper

The image distortion in microchannel plate detectors caused by the nonconstant curvature of the channels has been investigated experimentally using extreme-ultraviolet spectroscopy. A typical C plate with 25-micron-diameter pores is found to have a + or - 25-micron image distortion across the plate. Calibration of the image distortion improves the spectral line positions by a factor of 4, permitting solar-emission-line Doppler shift determination of + or - 2 microns (+ or - 1 km/s).

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