Remote asteroid surface analysis using ion thruster exhaust

Details Remote asteroid surface analysis using ion thruster exhaust Remote asteroid surface analysis using ion thruster exhaust

Oct 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990dres.iafcq....l&link_type=abstract

IAF, International Astronautical Congress, 41st, Dresden, Federal Republic of Germany, Oct. 6-12, 1990. 5 p.

Astronomy and Astrophysics

Astronomy

Asteroid Missions, Exhaust Emission, Ion Engines, Remote Sensing, Rit Engines, Chemical Composition, Mass Spectrometers, Planetary Surfaces

Scientific paper

Among the scientific objectives of an asteroid exploration mission is the identification of the chemical and elemental composition of the asteroid and its surface. A variety of remote and in situ methods are possible; one remote technique is Secondary Ion Mass Spectrometry (SIMS) where an ion beam is directed at the surface and sputters surface material which is then collected in a mass spectrometer. Since asteroid missions may well be electrically-propelled, the possibility of using an ion thruster as the source of the primary ion beam is examined here.

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