Characterizing Binary Stars Below the Diffraction Limit with CCD-based Speckle Imaging

Details Characterizing Binary Stars Below the Diffraction Limit with CCD-based Speckle Imaging Characterizing Binary Stars Below the Diffraction Limit with CCD-based Speckle Imaging

Dec 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006aj....132.2478h&link_type=abstract

The Astronomical Journal, Volume 132, Issue 6, pp. 2478-2488.

Astronomy and Astrophysics

Astronomy

6

Astrometry, Stars: Binaries: Visual, Techniques: Photometric

Scientific paper

An analysis of 15 speckle observations taken at the Lowell-Tololo Telescope at Cerro Tololo Inter-American Observatory and 6 speckle observations taken at the WIYN Telescope at Kitt Peak National Observatory indicates that it is possible to characterize the separations, position angles, and magnitude differences of binary stars down to at least one quarter of the diffraction limit with CCD-based speckle imaging. This is made possible by the fact that CCD-based speckle imaging permits the retrieval of reliable photometric information from speckle data, and therefore the elongation of the speckles due to a blended companion may be reliably measured. When observations in two colors are obtained, atmospheric dispersion, which also affects the speckle shape, can be distinguished from binarity in a large number of cases. A regimen for observing sub-diffraction-limited speckle binaries is proposed that could lead to efficient surveys of small-separation binary stars.

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