Planetary cratering - Statistical recognition of secondary-crater fields

Details Planetary cratering - Statistical recognition of secondary-crater fields Planetary cratering - Statistical recognition of secondary-crater fields

Jun 1980

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1980ncimc...3..193f&link_type=abstract

Nuovo Cimento C, Serie 1, vol. 3C, May-June 1980, p. 193-199.

Mathematics

Probability

Image Processing, Pattern Recognition, Planetary Craters, Probability Theory, Statistical Analysis, Cratering, Mars Surface, Mathematical Models, Photointerpretation, Planetary Mapping, Planetary Surfaces, Spaceborne Photography

Scientific paper

A statistical model of a cratered planetary surface is developed for the cases of primary impact events and a secondary crater field. The method of the strictly reflexive closeness of crater centers is used to test the crater-grouping tendency. Results show the differences, with regard to grouping probability, between a population of fictitious craters and that including a secondary field. Several crater surfaces on Mars and Mercury were studied by this method, and an upper limit for crater density was determined.

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