GIS-based Analysis of Secondary Craters as Stratigraphic Markers, Mars

Details GIS-based Analysis of Secondary Craters as Stratigraphic Markers, Mars GIS-based Analysis of Secondary Craters as Stratigraphic Markers, Mars

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.2699n&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.2699

Mathematics

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2

Scientific paper

We present the developmental successes and operational performance of a
GIS-based computer program that analyzes the spatial relationships of
secondary craters with potential parent craters to assist with Mars
geologic mapping.

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