Statistics – Applications
Scientific paper
Nov 2001
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001spie.4491..310h&link_type=abstract
Proc. SPIE Vol. 4491, p. 310-319, Subsurface and Surface Sensing Technologies and Applications III, Cam Nguyen; Ed.
Statistics
Applications
Scientific paper
Two broadband methods for simultaneously measuring the complex values of the permittivity and permeability of film-shaped materials are presented. The complex properties of these materials are calculated from S-parameter measurements of coplanar or microstrip cells propagating the quasi-TEM dominant mode. The S-parameter measurements are easy to be implement. They are carried out from a network analyzer and on-wafer systems allowing different sizes of cell and covering 0.05-40 GHz. In the case of the coplanar, the dispersion is very low for a cell shape such as h>W+2S. Thus, a fast extraction method of the coplanar substrate properties ((epsilon) r,(mu) r ) has been developed from analytical relationships. It is faster than the microstrip extraction method, which requires a numerical method for a rigorous analysis of the microstrip cell in order to take into account the quasi-TEM mode dispersion. Measured (epsilon) r and (mu) r data for several materials are presented in the 0.05 GHz to 40 GHz frequency range. These methods show good agreement between measured and predicted values.
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