Extraction and Analysis of Microcrater Residues Using Focused Ion Beam Microscopy

Details Extraction and Analysis of Microcrater Residues Using Focused Ion Beam Microscopy Extraction and Analysis of Microcrater Residues Using Focused Ion Beam Microscopy

Mar 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006lpi....37.1664b&link_type=abstract

37th Annual Lunar and Planetary Science Conference, March 13-17, 2006, League City, Texas, abstract no.1664

Computer Science

Scientific paper

We describe results from a new technique using dual beam FIB/SEM with
which impact residues can be extracted from microcraters and analysed by
EDS. This will allow the determination of residue compositions from
Stardust craters.

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